Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
نویسندگان
چکیده
منابع مشابه
Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
The use of spherical aberration correctors in the scanning transmission electron microscope (STEM) has the effect of reducing the depth of field of the microscope, making three-dimensional imaging of a specimen possible by optical sectioning. Depth resolution can be improved further by placing aberration correctors and lenses pre and post specimen to achieve an imaging mode known as scanning co...
متن کاملThree-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
The depth resolution for optical sectioning in the scanning transmission electron microscope is measured using the results of optical sectioning experiments of laterally extended objects. We show that the depth resolution depends on the numerical aperture of the objective lens as expected. We also find, however, that the depth resolution depends on the lateral extent of the object that is being...
متن کاملExperimental setup for energy-filtered scanning confocal electron microscopy (EFSCEM) in a double aberration-corrected transmission electron microscope
Scanning confocal electron microscopy (SCEM) is a new imaging mode in electron microscopy. Spherical aberration corrected electron microscope instruments fitted with two aberration correctors can be used in this mode which provides improved depth resolution and selectivity compared to optical sectioning in a conventional scanning transmission geometry. In this article, we consider a confocal op...
متن کاملThe Scanning Confocal Electron Microscope
The Scanning Confocal Electron Microscope, is an instrument which permits the observation and characterization of sub-surface structures of thick, optically opaque materials at nanometer level resolutions. The instrument merges the capabilities of the scanning, transmission and x-ray microscopes, and achieves unprecedented resolutions in optically dense materials, by implementing the technology...
متن کاملCharacterization of Nano-scale Instabilities in Titanium Alloys Using Aberration- Corrected Scanning Transmission Electron Microscope
Due to the refined nature of microstructures that can be effectively manipulated by the application of various thermal/mechanical processes, metastable beta titanium alloys have attracted considerable attention in recent days. Usually, such refinement involves the precipitation of the intragranular hcp structure alpha phase. In authors recent studies, it has been shown that the size, morphology...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2008
ISSN: 1742-6596
DOI: 10.1088/1742-6596/126/1/012083